ConferenceEngineeringData Science

International Conference on Deep Learning for Image-Based Defect Detection

ICDLIBDD

Mon, Aug 10, 2026
Suva, Fiji
About This Conference
The aim of the Conference is to provide a platform to the researchers and practitioners from both academia as well as industry to meet the share cuttingedge development in the field.
Call for Papers

deep learning
image-based defect detection
computer vision
predictive modeling
supervised learning
unsupervised learning
anomaly detection
feature extraction
convolutional neural networks
defect classification
industrial inspection
quality control
visual analytics
predictive maintenance
automated defect detection
manufacturing analytics
data preprocessing
model optimization
industrial IoT
pattern recognition

Important Dates

Start Date

Monday, August 10, 2026

Registration Deadline

Sunday, July 26, 2026

Submission Deadline

Tuesday, July 21, 2026

Venue
Suva, Central, Fiji

Suva, Central, Fiji

Deadline: Jul 21, 2026

Official Website
Quick Info
TypeConference
CountryFiji
MonthAugust-2026