ConferenceEngineeringData Science
International Conference on Deep Learning for Image-Based Defect Detection
ICDLIBDD
Fri, Apr 10, 2026
Sha Tin, Hong Kong
ConferenceEngineeringData Science
International Conference on Deep Learning for Image-Based Defect Detection
ICDLIBDD
Fri, Apr 10, 2026
Sha Tin, Hong Kong
About This Conference
The aim of the Conference is to provide a platform to the researchers and practitioners from both academia as well as industry to meet the share cuttingedge development in the field.
Call for Papers
deep learning
image-based defect detection
computer vision
predictive modeling
supervised learning
unsupervised learning
anomaly detection
feature extraction
convolutional neural networks
defect classification
industrial inspection
quality control
visual analytics
predictive maintenance
automated defect detection
manufacturing analytics
data preprocessing
model optimization
industrial IoT
pattern recognition
Important Dates
Start Date
Friday, April 10, 2026
Registration Deadline
Thursday, March 26, 2026
Submission Deadline
Saturday, March 21, 2026
Venue
Sha Tin, Hong Kong, Hong Kong
Sha Tin, Hong Kong