ConferenceEngineeringData Science

International Conference on Deep Learning for Image-Based Defect Detection

ICDLIBDD

Tue, Jul 14, 2026
Matola, Mozambique
About This Conference
The aim of the Conference is to provide a platform to the researchers and practitioners from both academia as well as industry to meet the share cuttingedge development in the field.
Call for Papers

deep learning
image-based defect detection
computer vision
predictive modeling
supervised learning
unsupervised learning
anomaly detection
feature extraction
convolutional neural networks
defect classification
industrial inspection
quality control
visual analytics
predictive maintenance
automated defect detection
manufacturing analytics
data preprocessing
model optimization
industrial IoT
pattern recognition

Important Dates

Start Date

Tuesday, July 14, 2026

Registration Deadline

Monday, June 29, 2026

Submission Deadline

Wednesday, June 24, 2026

Venue
Matola, Matola, Mozambique

Matola, Mozambique

Deadline: Jun 24, 2026

Official Website
Organizer

World Academics

John Richardson
Quick Info
TypeConference
CountryMozambique
MonthJuly-2026